IDN
|
Description
|
1 |
data set key (1 designates dataset 1,
etc.) |
2 |
wavelength (weighted mean) in
Angstroms |
3 |
wavelength line1 in Angstroms |
4 |
wavelength line2 in Angstroms |
5 |
wavelength line3 in Angstroms |
6 |
relative weight wavelength line1 |
7 |
relative weight wavelength line2 |
8 |
relative weight wavelength line3 |
10 |
linear absorption coefficient in
1/mm |
11 |
sort mode applied by SORTRF |
12 |
sorting order of hkl as slow/med/fast
(
312 is
l slow, k fast) |
13-15 |
a, b, c cell dimensions in Angstroms |
16-18 |
cosα, cosβ,
cosγ |
19-21 |
α, β, γ in cycles
(2π = 1.0000) |
22 |
cell volume |
23-25 |
e.s.d. of a, b, c in 13-15 |
26-28 |
e.s.d. of α, β, γ in
19-21 |
29 |
e.s.d. of cell volume in 22 |
|
|
31 |
sense of rotation of chi circle; +1 for
clockwise, -1 anticlockwise |
32 |
sense of rotation of phi circle
|
33 |
sense of rotation of theta or two theta
circle |
34 |
sense of rotation of omega circle |
35 |
reflection scanning method used during data
collection |
|
1= theta two theta 2= Wyckoff 3=
omega |
36 |
hkl permitted sign pattern as packed word
(0=-; 1=+) |
40 |
diffractometer type (1 char) E=Enraf Nonius,
G=GE-XRD, |
|
H=Hilger Watts, P=Picker, S=Siemens
(Nicolet/Syntex) |
|
T=Stoe, W=Philips, O=other. |
41-49 |
orientation matrix UB (11, 12, 13, ...,
33) |
50 |
monochromator two theta angle (in
degrees) |
51 |
monochromator perfection factor (0 to
1.) |
52 |
polarization ratio for incident beam on
crystal
|
53 |
e.s.d. of polarization ratio |
54 |
refinement weight of polarization
ratio |
55 |
dihedral angle between monochromator and
diffraction planes |
56 |
incident beam half width and
intensity |
57 |
polarization factor of source beam (0.0 to
1.0) |
|
|
81 |
temperature of cell and intensity
measurement in Kelvin |
82 |
pressure of cell and intensity measurement
in GPa |
|
|
85 |
experimentally measured crystal
density |
86 |
e.s.d. of 85 |
87 |
calculated crystal density |
88 |
e.s.d. of 87 |
89 |
wavelength of radiation used in cell
refinement |
90 |
number of hkl used in cell
refinement |
91 |
min theta for cell determination |
92 |
max theta for cell determination |
93 |
radiation used in cell and intensity
measurement as an element symbol or source (20
chars) |
94 |
type of radiation used in cell and intensity
measurement (1=neutrons,2=electrons, 3=X-ray Mo
Kα, 4=X-ray Cu Kα, 5=X-ray Ag
Kα,6=X-ray synchrotron ) |
|
|
100 |
number of scale groups |
101..100+n |
F relative scale factor for scale group n
(max=64) |
201..200+n |
scale group numbers associated with the
scale factors |
|
|
300 |
Number of crystal faces |
301-303 |
h, k, l of crystal face 1 |
304 |
distance of crystal face 1 from centre in
mm. |
305 |
angle phi of crystal face 1 |
306 |
angle chi of crystal face 1 |
307 |
angle kappa of crystal face 1 |
308 |
e.s.d. of distance (IDN 304) |
309 |
weight of distance (IDN 304) in
refinement |
311-319 |
as for 301-309 for crystal face 2, up to 20
faces |
|
|
501-502 |
min and max h for measured intensities
before averaging |
503-504 |
min and max k for measured intensities
before averaging |
505-506 |
min and max l for measured intensities
before averaging |
507-508 |
min and max θ for measured
intensities in degrees |
511 |
intensity measurement method (40
chars) |
512 |
radiation monochomator description (40
chars) |
513 |
absorption method applied (40 chars) |
514 |
intensity averaging process (40
chars) |
515 |
intensity reduction process (40
chars) |
|
|
521 |
total number of reflections measured |
522 |
number of reflections after averaging of
equivalents |
523 |
averaged coefficient Y (1=F; 2=
; 3=I) |
524 |
R-factor of averaged coefficients (sum of Y
diff)/(sum of Y) |
525 |
(sum of sigma(Y))/(sum of Y) |
526 |
absorption transmission T min |
527 |
absorption transmission T max |
|
|
531-535 |
criteria used for rcodes 1 to 5 (40 chars
each) |
536-540 |
number of reflections assigned rcodes 1 to
5 |
541 |
radius of crystal sphere/cylinder in
mm |
542 |
e.s.d. of radius |
543 |
refinement weight of crystal radius |
544 |
length of crystal cylinder in mm |
545 |
e.s.d. of crystal length |
546 |
refinement weight of crystal length |
547 |
counter dead time in microseconds |
548 |
e.s.d. dead time |
549 |
refinement weight of dead time |
550 |
wavelength of beta-filter absorption
edge |
551 |
crystal size max in mm |
552 |
crystal size mean in mm |
553 |
crystal size min in mm |
560 |
crystal colour (20 characters) |
561 |
crystal shape (20 characters) |
|
|
601 |
number of standard reflections |
602 |
number of reflections measured between
standards |
603 |
standards decay ratio |
604 |
time (in minutes) between standards |
610-612 |
h, k, l of standard reflection 1 |
613-615 |
h, k, l of standard reflection 2, up to 30
standards |
|
|
701 |
number of attenuator filters |
702 |
attenuator filter index for filter 1 |
703 |
reciprocal transmission factor (> 1.0)
for filter 1 |
704 |
e.s.d. in rec. transmission factor for
filter 1 |
705 |
refinement weight of rec. transmission for
filter 1 |
706-709 |
like 702-705 for filter 2 |
|
|
|
1
See program
ABSORB
for the definition
of angles.
|
|
|